Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/1884
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dc.contributor.authorSaji, Jerin-
dc.date.accessioned2022-12-14T08:15:50Z-
dc.date.available2022-12-14T08:15:50Z-
dc.date.issued2022-04-
dc.identifier.urihttp://hdl.handle.net/123456789/1884-
dc.description.abstractMicrowave circuits have a large application base, from biomedical fields to controlling quantum qubits inside a quantum computer. For the purpose of realising quantum systems and building a working quantum computer prototype, these circuits and devices needed to be thoroughly analysed, designed and precisely fabricated. The design and fabrication of these devices become tricky when dealing with high-frequency signals, and thus, this opens some exciting windows to study the effects of high-frequency signals on thin-film samples. The hall measurements are a well-known method to determine the carrier type, carrier concentration and mobility of a material. Measuring the DC hall on a sample requires putting point contacts, which destroys the sample for further use. This thesis tries to measure the Hall effect by a noninvasive method using high-frequency microwave signals. We designed and fabricated a homemade micro-strip circuit using photo-lithography and took measurements on nickel, germanium, graphene and bismuth selenide samples. The results obtained show that the hall field shows a linear increase with the applied magnetic field, and the phase is reversed when the magnetic field direction is reversed.en_US
dc.language.isoen_USen_US
dc.publisherIISER Mohalien_US
dc.subjectDesignen_US
dc.subjectfabricationen_US
dc.subjectmicrowave circuitsen_US
dc.subjectproposed microwaveen_US
dc.titleDesign and fabrication of microwave circuits for proposed microwave hall measurementsen_US
dc.typeThesisen_US
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