Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/1825
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dc.contributor.authorPegu, Akumoni-
dc.contributor.authorVenkatesan, A.-
dc.date.accessioned2021-12-15T05:38:47Z-
dc.date.available2021-12-15T05:38:47Z-
dc.date.issued2017-11-
dc.identifier.urihttp://hdl.handle.net/123456789/1825-
dc.description.abstractSurface plasmon frequency of different metal thin films Au, Ag, Cu, Ti, and Pd is simulated considering it as an important parameter for integra- tion into existing UV-VIS applications. Au is lucrative for 2.6 eV integra- tion and usage, while other metals Ag, Cu, Ti and Pd are responsive in UV regime up to 6.6 eV.en_US
dc.language.isoenen_US
dc.publisherIISERMen_US
dc.subjectPlasmonicen_US
dc.subjectTheory Behind Plasmonsen_US
dc.subjectElectromagnetic Wavesen_US
dc.titleSimulations and Experimental Characterization of Plasmonic Metals(Au and Pd)en_US
dc.typeThesisen_US
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